A Study on the Temperature Dependence of Electrical Resistivity and Crystallization in Amorphous Fe73.5B9Si13.5Cu1Nb3 Alloy

The temperature dependence of resistivity and crystallization behavior in amorphous Fe73.5B9Si13.5Cu1Nb3 alloy has been studied using the four probe electrical resistivity in the temperature range 300 K – 1000 K, Differential Scanning Calorimetry (DSC) in the temperature range 300 K – 1000 K and X-ray diffraction (XRD). From the resistivity measurements, the resistivity of the sample at 303 K is found to be 83.75 μΩ-cm. The Curie Temperature (TC), first step of crystallization and second step of crystallization of the sample are around the temperatures 593 K, 733 K and 883 K respectively. Thus, the resistivity measurements on the sample shows that the amorphous sample undergoes crystallization in two steps which is supported by DSC measurements on the amorphous sample . The Temperature Coefficient of Resistivity (TCR) and the Debye temperature (θD) of the sample are found to be 19 X 10-4 K-1 and 364.05 K, respectively. XRD patterns of the amorphous Fe73.5B9Si13.5Cu1Nb3 ribbon annealed at 673 K showed α-Fe(Si) phase without any other phase. For the amorphous sample annealed at 823 K, Fe2B phase appeared in addition to α-Fe(Si).